Measurement of the Casimir force between superconductors
cond-mat.mes-hall, cond-mat.supr-con, quant-ph
Submitted: 2025-01-23
Updated: 2026-05-06
Comments: 6 pages main text (4 figures), 5 pages methods (4 figures), 15 pages supplementary information (22 figures)
Journal ref: Nat Commun 17, 8827 (2026)
DOI: 10.1038/s41467-026-75261-9
License: http://creativecommons.org/licenses/by/4.0/
The gist: The Casimir force follows from quantum fluctuations of the electromagnetic field and yields a nonlinear attractive force between closely spaced conductive objects.
Terminology
Abstract
The Casimir force follows from quantum fluctuations of the electromagnetic field and yields a nonlinear attractive force between closely spaced conductive objects. Measuring the Casimir force in superconducting materials on either side of the transition should allow to isolate the specific contribution of low frequencies to the Casimir effect. There is significant interest in this contribution as it is suspected to be involved in an unexplained discrepancy between predictions and measurements of the Casimir force between normal metals. Here, we observe a force acting on a superconducting drum resonator integrated in a microwave optomechanical cavity through the nonlinear dynamics this force imparts to the resonator. The measured dynamics points to an extremely intense force found to be compatible in magnitude with the Casimir force for the range of vacuum separations that can be expected in this device, and incompatible with estimates of other known sources of nonlinearity. This nonlinearity is intense enough that, with a modified design, this device type should operate in the single-phonon nonlinear regime. Accessing this regime has been a long-standing goal that would greatly facilitate quantum operations of mechanical resonators.
Sources
- Simulating the electrostatic patch force in experimental geometries
- High-Resolution Casimir Force Sensing Across a Superconducting Transition
- Dependence of Electrostatic Patch Force Evaluation on the Lateral Resolution of Kelvin Probe Force Microscopy
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