Detecting Defects that Matter: An Application-Driven Benchmark for Anomaly Detection in Manufacturing and Retail Logistics (VAND 4.0 Challenge)

Existing Anomaly Detection benchmarks are saturated and often unrealistic. As part of the VAND 4.0 Challenge, we introduce a hidden-test, application-driven benchmark across two deployment-critical domains: industrial manufacturing and retail logistics. In the Industrial Track (MVTec AD 2), the results reveal that unsupervised anomaly segmentation remains challenging: the best regular-setting method achieves only 57% pixel-level SegF 1, indicating substantial room for improvement. Zero-shot approaches trail by 15 SegF 1 points, confirming that task-specific training on normal data remains essential for precise defect localization. Robustness to distribution shifts remains a key open challenge and DINOv3-backbones clearly dominate this track. In the Retail Track (Kaputt 2), the results reveal that (1) supervised defect detection is approaching saturation for common defect types; (2) the best off-the-shelf VLM approach trails specialized models by 28 AP, confirming that currently VLMs cannot replace fine-tuned detectors, (3) reference images did not prove helpful for top-performing approaches. Performance collapses on rare defects (spillage 53 AP, missing units 27 AP), where the supervised ceiling is bounded by data availability. To drive future progress in this domain, we provide a new low-prevalence retail AD dataset (Kaputt-Rare). Across both tracks, computational efficiency is assessed as a first-class metric combining performance, throughput, memory, and power consumption. We introduce a novel metric for measuring efficiency and reveal that that top-performing methods rely on heavy architectures while efficiency is largely neglected. Overall, we conclude that the community needs (a) more efficiency-aware method development, and (b) true anomaly detection approaches for rare defects and shifting conditions. https://sites.google.com/view/vand4-cvpr2026/challenge